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- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Application Report XRD 13 - D2 PHASER Desktop XRD
- 9th TOPAS Users´ Meeting in Bad Herrenalb, Germany
- Bruker Expands in China with Opening of Second Major Applications, Training and Service Center in Shanghai
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
D8 FOCUS – Your Dedicated Performer for Powder Diffraction
The D8 FOCUS is the key to the world of powder diffraction. Based on the D8 Series II technology, the D8 FOCUS meets our highest quality standards for uncompromising performance and data integrity. Hardware and software are optimized for easy operation, making the D8 FOCUS the ideal instrument for universities and multi-user laboratories alike.
Simple choices for optimal performance
The focusing Bragg-Brentano geometry with slits provides the best resolution for flat powder samples. For irregularly-shaped samples and non-ambient measurements, the parallel beam geometry with a Göbel mirror is the optimum setup.
You need both? No problem! Optics and sample holders can be exchanged without tools or alignment.
Choose the detector for your application!
The standard detector is the scintillation counter, with high dynamic range and low internal background. If you have fluorescent samples, you can lower that background and increase the sensitivity using the energy dispersive SOL-XE detector.
You need fast results? Sure! The LYNXEYE linear detector can accelerate your measurements by a factor of up to 200!
What information do you get?
X-ray diffraction with the D8 FOCUS can identify and quantify the different phases inside a powder sample. For new materials, you can solve and refine the crystalline structure using the TOPAS software.
The same data also provides information on the crystallite size and the microstrain.
Adding a temperature chamber allows you to perform non-ambient investigations and observe phase changes.
More Information
Göbel Mirrors – Properties and Potentials (PDF spec sheet)
Specimen Holders for X-ray Diffraction – Proper sample handling for accurate results (PDF spec sheet)
SOL-XE energy dispersive X-ray detector (PDF spec sheet)
LYNXEYE Super Speed Detector for X-ray Powder Diffraction DOC-S88-EXS027 V4.pdf (PDF spec sheet)
D8 FOCUS – Diffraction Solutions (PDF brochure)


