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- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- Bruker Expands its Small Angle X-ray Scattering (SAXS) Product Portfolio
- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Application Report XRD 13 - D2 PHASER Desktop XRD
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- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
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Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
D2 PHASER with XFlash® 430 – Combined XRD, EDXRD and XRF Analysis
- D2 PHASER - Combined XRD, EDXRD and XRF Analysis
The novel D2 PHASER with XFlash® 430 detector represents the first benchtop system offering angle-dispersive X-ray diffraction (XRD), energy-dispersive X-ray diffraction (EDXRD) as well as simultaneous X-ray fluorescence (XRF) measurements under ambient conditions.
XFlash® detector can be switched to an arbitrary wavelength
For XRD, the superb energy resolution of the XFlash® 430 allows for excellent filtration of undesirable Kβ, white radiation as well as sample fluorescence for highest quality powder patterns with best peak to background ratio. While for standard powder XRD the Kα1,2 dublett is employed, the XFlash® detector can additionally be switched to an arbitrary wavelength within the X-ray spectrum. Typically, this would be Kβ in order to obtain monochromatic powder patterns with high intensity, avoiding peak overlap inherent to the commonly used Kα radiation (Kα1,2 doublets). Observed line profile widths (FWHM) are identical to those of "classic" point detectors such as scintillation and proportional counters, i.e. better than 0.05° 2Ө for SRM660a with CuKα.
Unique to the D2 PHASER with XFlash® is its capability to obtain EDXRD patterns at user-defined 2Ө positions. This mode allows extremly fast measurements, as a large wavelength range emitted by the X-ray source is being utilized. At the same time it is possible to perform analysis of coatings, or layers from different penetration depths of the investigated structure.
Successful phase identification and quantitative analysis
XRF data are collected simultaneously with either XRD or EDXRD measurements, providing for element identification and monitoring of concentrations (K - Hf). Knowing the (partial) elemental composition of the sample greatly assists successful phase identification and quantitative analysis of unknown samples or of samples with similar diffraction patterns. Additionally, quantitative phase analysis results can be validated by comparing the calculated elemental composition with the actually measured elemental composition.
