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- XFlash® 6 – Bruker Introduces the Next Generation of EDS Detectors
- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
QUANTAX EBSD CrystAlign – The Easy to Use EBSD Analysis System
- SEM chamber with sample on the left, EBSD detector screen (lower right) with ARGUS FSE/BSE detector, EDS detector (top right) and microscope pole piece (top)
Bruker Nano's QUANTAX CrystAlign EBSD analysis system provides the analyst with an easy to use yet fully functional tool for EBSD measurement and evaluation. The system can also be used in conjunction with the QUANTAX EDS system for simultaneous EBSD and EDS analysis.
- In-situ vertically adjustable e-Flash EBSD detector series for maximum analytical flexibility, now includes the ARGUS™ forescattered / backscattered electron imaging system
- Fast acquisition with 630 patterns/s (4x4 binning) or 850 patterns/s (8x8 binning) using the e-Flash1000 detector
- High resolution pattern acquisition with the e-FlashHR, providing pattern images of up to 1600x1200 pixels
- LED detector position indicator and multiple features for safe operation
- Fully software controlled detector with all electronics integrated
- Simultaneous EBSD and EDS acquisition at highest possible speed
- Easy to use EBSD software with a single user interface
- Fast re-indexing with up to 54,000 points/s
- Signal Assistant for acquisition setup
- Calibration Assistant for geometrical setup
- Arbitrarily selectable scan areas
