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- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
- Bruker Announces the e-Flash HR – a New High-Resolution EBSD Detector
- Bruker AXS in Karlsruhe has new phone numbers
- Prof. David C. Joy wins 2010 Duncumb Award for Excellence in Microanalysis
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
QUANTAX EBSD CrystAlign – The Easy to Use EBSD Analysis System
- SEM chamber with sample on the left, EBSD detector screen (lower right) with ARGUS FSE/BSE detector, EDS detector (top right) and microscope pole piece (top)
Bruker Nano's QUANTAX CrystAlign EBSD analysis system provides the analyst with an easy to use yet fully functional tool for EBSD measurement and evaluation. The system can also be used in conjunction with the QUANTAX EDS system for simultaneous EBSD and EDS analysis.
- In-situ vertically adjustable e-Flash EBSD detector series for maximum analytical flexibility, now includes the ARGUS™ forescattered / backscattered electron imaging system
- Fast acquisition with 630 patterns/s (4x4 binning) or 850 patterns/s (8x8 binning) using the e-Flash1000 detector
- High resolution pattern acquisition with the e-FlashHR, providing pattern images of up to 1600x1200 pixels
- LED detector position indicator and multiple features for safe operation
- Fully software controlled detector with all electronics integrated
- Simultaneous EBSD and EDS acquisition at highest possible speed
- Easy to use EBSD software with a single user interface
- Fast re-indexing with up to 54,000 points/s
- Signal Assistant for acquisition setup
- Calibration Assistant for geometrical setup
- Arbitrarily selectable scan areas
