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- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Alcon Selects Bruker ContourGT 3D Microscope for Intra-Ocular Lens R&D
- Bruker’s AcuityXR Receives R&D 100 Award for Technological Innovation
- Bruker Expands in China with Opening of Second Major Applications, Training and Service Center in Shanghai
Upcoming Events
- The Benefits of TXRF for Education and University Research
Mar 07, Webinar - PITTCON 2012
Mar 11-15, Orlando, Florida, USA - APEX2 Workshop – Twinning and Disordered Samples
Mar 20-22, Taipei, Taiwan - ARAB LAB 2012
Mar 26-29, Dubai, UAE - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
ContourGT-X8 PSS Non-Contact 3D Optical Profiler
- ContourGT-X8 PSS Non-Contact 3D Optical Profiler
High-Throughput, Precision Surface Metrology for HB-LED PSS Production
The ContourGT-X8 PSS provides highly repeatable, high-throughput, precision surface metrology of high-brightness light-emitting diode (HB-LED) patterned sapphire substrates (PSS). Based on the flagship ContourGT™ X8, this special configuration combines advanced non-contact 3D measurement capabilities with unique Bruker PSS metrology hardware and software, and a Wafer Automation System Developer's Kit (SDK) that provide a tailored solution for PSS quality assurance and quality control applications.
Feature Set Tailored for Automated HB-LED PSS Metrology
- Simultaneous measurement of height, width, and pitch of multiple PSS features
- Fast and easy multi-region automation, pass-fail, reporting and databasing
- Optimized, easy integration with automated substrate handlers
- Unmatched vibration immunity with excellent gauge repeatability and reproducibility
Unmatched Measurement Capabilities with Highest Vertical Resolution over Industry's Largest Field of View
- Unique, thermally stabilized 115X objective with 2X magnifier provides 230X magnification
- Sub-angstrom-to-millimeter vertical range delivers unparalleled measurement flexibility
Unique Metrology Hardware for Enhanced Reliability and Repeatability in Production Environments
- Patented dual-source illumination with high-brightness LEDs provides superior measurement quality
- Patented automatic self-calibration capability ensures tool-to-tool correlation, measurement accuracy, and long term system stability
64-bit, Multi-Core Compute Platform with Vision64 Software for Accelerated Surface Measurement and Analyses
- Parallel processing using multi-core optimization and other techniques provides up to 10X higher throughput on critical metrology analyses
- Unmatched stitching capability seamlessly synthesizes thousands of individual datasets into one contiguous image
Highly Intuitive User Interface with Best-in-Class Ease of Use, Automation, and Analysis
- Streamlined user interface simplifies measurement and data acquisition to increase system and personnel efficiency
- Unique visual workflow tools provide intuitive access to an extensive library of filters and analysis options
More Information
ContourGT-X8 Patterned Sapphire Substrate Non-Contact, 3D Optical Profiler (PDF Brochure)
ContourGT Objectives Chart (PDF Datasheet)
Bruker´s Support Programs – Nano Surfaces Business (PDF brochure)
Precision Tools Support Critical PSS Metrology from R&D through High-Volume LED Fabrication (Publication, Sep. 2011 -- LEDs Magazine)
