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ContourGT-X8 Optical Profiler

ContourGT-X8 Optical Profiler
ContourGT-X8 Optical Profiler

Automated, Gauge-Capable Metrology for Process Quality Control

The ContourGT-X8 provides the highest speed, accuracy, and range for 3D, non-contact surface measurement of ophthalmic lenses, medical devices and tools, high-brightness LEDs, semiconductor devices, through-silicon vias and trenches, solar cells, and precision machined parts. The gauge-capable system offers a stable, robust platform for the production ramp into high-volume manufacturing. A proprietary internal laser reference provides self-calibration to minimize dependence on step standards, and compensates for system drift from environmental or mechanical instability.

New Vision64 Operation and Analysis Software provides the industry's most functional and streamlined graphical user interface, combining intelligent architecture with intuitive visual workflow and extensive user-defined automation capabilities for fast and comprehensive data collection and analysis. The ContourGT-X8 is the most advanced optical interferometric profiler available today.

Unmatched Measurement Capabilities with Highest Vertical Resolution over Industry’s Largest Field of View

  • Magnifications from 0.5X to 200X enable characterization of a wide range of surface shapes and textures
  • Sub-angstrom-to-millimeter vertical range at any magnification delivers unparalleled measurement flexibility
  • High-resolution camera option increases lateral resolution

Unique Metrology Hardware for Enhanced Reliability and Repeatability in Production Environments

  • Patented dual-source illumination with high-brightness LEDs provides superior measurement quality and magnification flexibility
  • Optimized hardware design improves vibration, system robustness, and measurement stability
  • Patented automatic self-calibration capability ensures tool-to-tool correlation and measurement accuracy and repeatability

64-bit, Multi-Core Processor with Vision64 Software for Accelerated Surface Measurement and Analyses

  • New architecture yields order of magnitude increase in application data processing capacity
  • Parallel processing using multi-core optimization and other techniques provides up to 10X higher throughput on critical metrology analyses
  • Unmatched stitching capability seamlessly synthesizes thousands of individual datasets into one contiguous image

Highly Intuitive User Interface with Best-in-Class Ease of Use, Automation, and Analysis

  • Streamlined user interface simplifies measurement and data acquisition to increase system and personnel efficiency
  • Unique visual workflow tools provide intuitive access to an extensive library of filters and analysis options
  • Customized reporting distills analysis data for customer-specific requirements

More Information

ContourGT 3D Optical Microscopes (PDF Brochure)

ContourGT-X Specifications (PDF Datasheet)

ContourGT Objectives Chart (PDF Datasheet)

Improved Copper Wire Bonding with Non-Contact Metrology (Mar 2012 – Solid State Technology)

3D Interferometric Microscopy Reveals Medical Implant Wear Mechanisms (Oct 2011 – Laser Focus World)

Bruker´s Support Programs – Nano Surfaces Business (PDF brochure)

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