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- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Bruker Introduces the Alloy Guide App for Mobile Devices
- Bruker Announces $1.3 Million Contract with ThyssenKrupp Stainless USA
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
Full Control over Coating Processes
- M1 MISTRAL µ-XRF spectrometer
Bruker's XSpect software package supports layer analysis with the M1 MISTRAL and M4 TORNADO micro-X-ray fluorescence (µ-XRF) spectrometers. Single layers as well as complex coating systems can be analyzed with this easy-to use software package. Layer thicknesses can range from below 1 nm to several dozens of µm, depending on layer composition. A layer may consist of up to 25 elements.
Application examples for layers that can be a analyzed are
Coatings for metal finishing (corrosion protection, chromium plating):
- Valves and accessories
- Automotive parts
Functional coatings:
- Electric contacts
- Active catalyst layers
- Microelectronics
Decorative layers:
- Jewelry
- Consumer goods
Fundamental paramater quantification model for accurate results
XSpect’s advanced Fundamental Parameter (FP) model is used for coating quantification. This supports the wide range of different applications, as listed above. The FP model
- Delivers quantitative results on both layer composition and thickness
- Can be used for standardless and standard-based analysis
- Allows to analyze even most complex layer systems with practically up to 12 layers with 25 elements per layer (theoretically arbitrary layer and element numbers)
Powerful analytical software for fast and easy operation
- XS-Tools for layer analysis, part of the Bruker XSpect software
The proven instrument software has been further extended to support layer
analysis. It features
- Click & go exact sample positioning supported by a high-resolution CCD camera and auto focus (motorized stage)
- Convenient selection of layer system to be analyzed
- Standards database
- User customizable report templates
- Single click data export to MS Excel®
More Information
Download coating analysis PDF brochure in English
M1 MISTRAL (PDF brochure in English)
M4 TORNADO (PDF brochure in English)
