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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
AFM Brochures and Datasheets
BioScope Catalyst - Life Science Atomic Force Microscope (B069) | |
The best research instruments not only acquire the intended data, but actually increase productivity. Bruker’s BioScope™ Catalyst™ Atomic Force Microscope (AFM) accelerates innovative research by reducing the time and effort needed to combine the proven techniques of light microscopy with the unique benefits of atomic force microscopy. |
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Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. Bruker’s Support Programs will help ensure that your investment is protected, and that you and your Bruker instrument are always operating at peak performance. |
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The Dimension® Edge™ Atomic Force Microscope (AFM) System incorporates the latest technology advances to provide the highest levels of performance, functionality, and accessibility in its class. Based on the ultimate Dimension Icon® platform, the Edge System has been designed from top to bottom to deliver the low drift and low noise necessary to achieve publication ready data in minutes instead of hours, all at price points well below expectations for such performance. In addition, integrated visual feedback and preconfigured settings enable expert level results simply and consistently, making the most advanced large-sample atomic force microscopy capabilities and techniques available to every facility and user. |
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Bruker’s Dimension® Edge™ PSS is the ideal metrology and inspection system for LED substrate and epi manufacturers. As an extension of the Dimension Edge atomic force microscope (AFM) platform, the Edge PSS incorporates the incredible value and resolution for which the Dimension systems are renowned. Bruker’s proprietary AutoMET™ software has been designed specifcally to meet the needs of patterned sapphire substrate (PSS) suppliers, providing a level of automation and ease of use never before seen in a value-price AFM. |
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Dimension Fastscan - The World's Fastest Atomic Force Microscope (B077) | |
The Dimension® FastScan™ atomic force microscope (AFM) delivers, for the first time, extreme imaging speed without sacrificing legendary Dimension Icon® resolution and performance. This breakthrough innovation enables radically faster time to publishable data for all levels of AFM expertise. Download the PDF with animation (Adobe Acrobat Reader X) |
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Dimension Icon AFM-Raman - Highest Performance AFM with Co-Localized μ-Raman Capability (DS095) | |
Today’s requirements on micro- and nanoscale characterization instrumentation go far beyond the capabilities of a single measurement method. The complimentary techniques of atomic force microscopy and Raman microscopy provide critical information on both the topography and the chemical composition of a sample. When these techniques are further enhanced with advanced AFM modes, such as Bruker exclusive PeakForce TUNA™ electrical characterization and PeakForce QNM® quantitative nanomechanical mapping, researchers are able to better understand the mechanisms that lead to specific material properties. |
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Dimension Icon - Atomic Force Microscope System with ScanAsyst (B068) | |
Bruker’s Dimension® Icon® Atomic Force Microscope (AFM) System introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized large-sample AFM platform, the latest Dimension system is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility. The system has been designed from top to bottom to deliver the revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours. The Dimension Icon also is now equipped with proprietary ScanAsyst® automatic image optimization technology, which enables easier, faster, and more consistent results, regardless of user skill level. Highest level AFM research with radical productivity gains has never been easier to achieve. |
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Bruker’s Environmental Control packages for atomic force microscopes (AFMs) enable a wide range of new AFM research. Available for Bruker’s Dimension® Icon®, Dimension Edge™, and MultiMode® 8 AFMs, the packages provide turnkey solutions for the most stringent 1-ppm gas purity requirements. In combination with Bruker’s exclusive PeakForce TUNA™ module and electrochemical accessories, the Environmental Control packages fully address the challenges of sample preservation and artifact avoidance, enabling for the first time the in situ nanoelectrical and electrochemical characterization of organic photovoltaics (OPVs) and Lithium ion cathodes. |
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Innova - Superior AFM Research Performance and Versatility (B067) | |
The Bruker Innova® atomic force microscope (AFM) delivers accurate, high-resolution imaging and a wide range of functionality for the physical, life, and material sciences. As a highly configurable and customizable system, Innova also offers application flexibility for the most demanding scientific research at a moderate cost. Its unique state-of-theart closed-loop scan linearization system ensures accurate measurements and noise levels approaching those of openloop operation. Innova delivers atomic resolution with great ease and scans up to 90 microns in closed-loop without the need to change scanner hardware. The integrated, highresolution color optics, open stage, and new software with experiment selector make setting up each new experiment fast and easy. |
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Innova-IRIS - AFM and Spectroscopy without Compromise (DS096) | |
Innova-IRIS builds on leading AFM performance to provide the best TERS-enabled AFM-Raman integration available. It integrates seamlessly with the Renishaw inVia micro-Raman system while fully preserving the capabilities of each separate component. The result is a productive and complete integrated platform for correlated micro and nanoscale property mapping and for extending the boundaries of nanoscale spectroscopy. |
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The InSight® 3D Atomic Force Microscope (AFM) provides unparalleled accuracy and precision required for non-destructive, high-resolution 3D measurements of critical 45nm and 32nm semiconductor features. Bruker’s Insight 3D AFM provides the lowest measurement uncertainty for critical dimension (CD) and sidewall angle (SWA) metrology, which directly leads to improved process control. |
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The MultiMode® is the world’s most field-proven atomic force microscope (AFM), with thousands of systems installed worldwide. Its success is based on its superior resolution and performance, its unparalleled versatility, and its proven record of productivity and reliability. Today’s MultiMode 8 greatly surpasses previous generations. Bruker’s new Peak Force Tapping® technology has enabled exclusive new operating modes that deliver new information, superior ease of use, even higher performance, and new levels of speed and productivity. |
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The PeakForce TUNA™ module builds on Bruker’s exclusive PeakForce Tapping® technology to provide the most complete and highest resolution property mapping to date. Available only on Bruker’s Dimension® Icon® and MultiMode® 8 atomic force microscopes (AFMs), PeakForce TUNA enables, for the first time, quantitative conductivity mapping on fragile samples, such as organic photovoltaics, lithium ion cathodes, and carbon nanotube assemblies, while eliminating the adverse effects caused by sample damage and tip contamination. |
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PeakForceTM QNM® is a patent-pending, groundbreaking atomic force microscope (AFM) imaging mode that provides AFM researchers unprecedented capability to quantitatively characterize nanoscale materials. It maps and distinguishes between nanomechanical properties, including modulus and adhesion, while simultaneously imaging sample topography at high resolution. PeakForce QNM operates over an extremely wide range, approximately 1 MPa to 50 GPa for modulus and 10 pN to 10 μN for adhesion, enabling characterization of a large variety of sample types. |
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Perfusing Stage Incubator for the BioScope Catalyst AFM (B075) | |
The BioScope™ Catalyst™ Perfusing Stage Incubator is specifically designed to facilitate cell biology studies using simultaneous atomic force microscopy (AFM) and optical methods. The stage incubator supports a broad range of incubation and perfusion options, including continuous or intermittent liquid perfusion, heating (with Catalyst heater stage), and maintenance of carbon dioxide buffered media. These capabilities enable researchers to maintain ideal cell culture conditions for long-duration live cell studies, extending cell viability for many hours or even days. |
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ScanAsyst - Exclusive Self-Optimizing AFM Imaging Mode (B071) | |
ScanAsyst® is the world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate. Intelligent algorithms continuously monitor image quality to make appropriate parameter adjustments. This makes imaging as easy as simply selecting a scan area and scan size for almost any sample in either air or fluid. |
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