Atomic Force Microscopy - The new product line of Bruker AXS

Bruker Nano provides Atomic Force Microscope/Scanning Probe Microscope (AFM/SPM) products that stand out from other commercially available systems for their robust design and ease-of-use, whilst maintaining the highest resolution. The NANOS measuring head, which is part of all our instruments, employs a unique fiber-optic interferometer for measuring the cantilever deflection, which makes the setup so compact that it is no larger than a standard research microscope objective.

The firm basis for the quality of our microscopes is a team of experienced scientist and engineers with a background of more than 15 years in the AFM business.

 

N8 ARGOS

Our N8 product series - from small to 300 mm sample AFM

The NANOS is a certainly unique concept that provides AFM/SPM capabilities as an add-on/upgrade for existing microscopes, or as a fully featured stand-alone system for even very large samples. NANOS N8 Products

(left) optical image, size 800 µm (right) image size 4 µm

NANOS AFM/SPM products - Unique Features

It may be surprising to learn that almost any research grade optical microscope can be upgraded to an AFM inspection system, but Bruker microscopes provide even more advantages ... Features

Magnetic domains in a YIG sample

Techniques and methods

The NANOS N8 product series provides a wide range of AFM / SPM methods. The concept is modular and allows for upgrading an existing microscope step by step. Techniques