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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
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- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
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Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
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Atomic Force Microscopy Webinar Series Archive
An Open and Free Resource for Atomic Force Microscope Owners and Users
Subscribe today to our Free Learning Resource AFM Webinar e-newsletter!
Our archived atomic force microscopy webinars are provided in .wmv format below for your convenience. No registration is needed to watch a Bruker recording.
You may also enjoy watching our recordings now available on our YouTube channel — www.youtube.com/BrukerNanoSurfaces
Webinar | Content |
April 11, 2012 AFM Enhancing Traditional Electron Microscopy Applications | This webinar takes a look at recent AFM technical advances that provide a highly productive nano-imaging workflow, akin to current electron-microscopy based techniques. Improvements in speed, productivity/usability, and materials characterization are opening new possibilities for research topics, samples, and work environments. We will review and compare a range of applications where the AFM offers either complementary information, or a potentially easier path to research results. |
March 14, 2012 The Powerful Diversity of the AFM Probe | This webinar explains how the AFM probe's key specifications effect its performance, and determine its suitability for a particular application. With this tutorial you will be able to better select any AFM probe as well as make better decisions on how to optimize your experiment through the probe characteristics. Basic and advanced issues will be addressed in this fun and informative webinar. |
February 15, 2012 Advances in NanoScale Thermal Analysis: Transition Temperature Microscopy | This webinar is focusing on recent advances in AFM based nanoscale thermal analysis. Atomic force microscopy is entering an era where it can provide quantitative nanoscale property information with statistically meaningful sampling. This capability is particularly relevant on polymer based samples, where molecular scale heterogeneity is intrinsic. |
January 18, 2012 Combined Optical and Atomic Force Microscopy | Modern applications and scientific fields like biology demand more information than an optical or atomic force microscope can provide alone. It is therefore essential to enhance and integrate data provided by AFM technologies with optical imaging techniques like bright-field, differential interference contrast, epifluorescence, total internal reflection fluorescence, and confocal. This webinar presentation will reveal the top capabilities and latest innovations of the world's most productive and completely integrated life science AFM and light microscope platform. |
December 7, 2011 True 3D Nanometrology & Quantitative Material Property Mapping | Hosted by Microscopy & Analysis and sponsored by Bruker Nano Surfaces Division, this webinar will focus on the Dimension FastScan atomic force microscope used to obtain true 3D nanometrology and quantitative material property mapping in ambient, fluid, and controlled environments to give an SEM-like user experience. Don't miss this unique webinar presentation. |
November 16, 2011 Advances and Applications in Electrochemical Atomic Force Microscopy | Electrochemical AFM allows in situ, real-time monitoring of electrochemical processes such as electroplating, corrosion, charging & discharging of batteries, and bioelectrochemical reactions. The modern advances in atomic force microscopy technology makes AFM imaging in liquid and stringent environmental conditions a much easier task while, additionally, providing mechanical property mapping. This presentation is your chance to see the foremost electrochemical atomic force microscopy techniques and discover the new applications made available with the latest AFM technologies. |
November 3, 2011 Atomic Force Microscopy meets Raman Spectroscopy | Hosted by C&EN and sponsored by Bruker, this webinar will start with a brief introduction into Raman spectroscopy and atomic force microscopy. Examples of instrumentation for combining both techniques will be given and highlighted using application examples. The webinar will conclude with an introduction to Tip Enhanced Raman Spectroscopy (TERS). Users of both techniques would benefit from attending to learn about the benefits for combining Raman and AFM. |
October 19, 2011 Advances in AFM Technology for Microbiological Research | In this presentation, we discussed the most recent advances in AFM technology for facilitating new avenues of research in microbiology, including high-speed AFM imaging, optically-guided force spectroscopy, nanomechanical mapping of individual bacterial cell surfaces, and more. |
September 28, 2011 Dimension FastScan: Imaging Dynamic Processes at the Nanoscale |
High speed AFM imaging of processes at the nanoscale has seen a number of recent breakthroughs including the launch of the world's fastest atomic force microscope, the Dimension FastScan, and is beginning to play a tangible role in visualizing processes which could previously only be studied indirectly. This exclusive presentation includes a review of the progress in instrumentation that is enabling this new field, a clearly defined set of performance requirements for high speed AFM imaging, and careful examination of dynamic imaging applications in both air and fluid. This webinar also shares unique data of polymers, protein films, and live bacteria, while exploring dynamic nanoscale imaging as it becomes available to a broader community of researchers. |
September 20, 2011 Advances in High-Brightness LED Metrology Capabilities for R&D and Production Inspection | Atomic force microscopy (AFM), 3D optical microscopy, and stylus profilometry provide highly complementary measurement capabilities required for adequate design & process control needs that are being driven harder than ever by the worldwide advances in high-brightness LED manufacturing. This exclusive webinar presentation demonstrated how the three surface measurement systems combine to meet critical requirements in a highly cost-effective manner. Visit and bookmark the HB-LED applications page |
August 17, 2011 Quantitative Imaging of Living Biological Samples by PeakForce QNM Atomic Force Microscopy | The promising PeakForce QNM® imaging mode and Peak Force Tapping™ technique applied by the BioScope™ Catalyst™ AFM microscope look to provide the acquisition speed and quality resolution needed to measure the mechanical properties of living cells ex vivo — thereby surpassing the previous limitations of force spectroscopy used for life science research. This webinar presented the exciting topic which showed an overview of the biological samples that can be imaged, the unique information that can be extracted from the AFM data, probe specifications for fluid and air, and the new potential for AFM microscopy that has opened with these techniques and technologies. Watch the recording on your machine - [Windows Media] |
July 20, 2011 Co-Localized AFM and Raman Applications | With the advent of ScanAsyst, nanomechanical analysis, and high speed imaging atomic force microscopes, metrology has entered a new era of ease-of-use, increased productivity, and ever-improving information content. It is a logical next step for atomic force microscopy (AFM) to combine its capabilities with traditional spectroscopic methods. Raman is a traditional spectroscopic method that offers insights into the chemical and structural nature of compounds. In this presentation, Bruker will be introducing the AFM and Raman users to the respective techniques. The presentation will also include a discussion of a wide variety of AFM-Raman configurations. Finally, the webinar presentation will look at TERS (tip enhanced Raman scattering) - which uses the capabilities of the AFM tip as the source for Raman imaging. Watch the recording on your machine - [Windows Media] |
May 25, 2011 High Speed AFM Imaging: Survey, Screening, and Dynamics with Bruker's Revolutionary Dimension FastScan Atomic Force Microscope |
Atomic Force Microscopy has long been somewhat constrained to applications where its unique information and flexibility outweigh its limited imaging bandwidth. Academic efforts to increase the speed of atomic force microscopes (AFMs), while exciting, were generally tightly focused at time resolving nanoscale processes, and were achieved in part by sacrificing versatility. To boost the productivity of atomic force microscopy for a broad range of applications, each AFM system component must support and contribute to higher imaging speeds, while maintaining such characteristics as large scan range, excellent noise performance, flatness and force control. Furthermore, only an easy, stable and high productivity work flow will take advantage of the enhanced hardware performance. Discussed in this recording see how the new Dimension FastScan™ Atomic Force Microscope enables higher AFM productivity through higher bandwidth, and how this additional bandwidth can enable Survey, Screening and Dynamics discovery in science and development. If the recording requires you to install a codec to view, please install the GoToMeeting 2.0 Decoder Codec. Once you have installed the codec, you will not need to do so again. Watch the recording - [Requires Codec] |
April 20, 2011 Applications in High Volume Semiconductor Manufacturing | In-line AFM metrology provides critical information for advanced process control and process development. In this webinar, we explored the unique and critical role played by AFM and AFP. Topics covered were Front End of Line (FEOL) applications such as STI etch, divot and CMP metrology; gate metrology including stress liners and novel FET structures; Back End of Line (BEOL) contact and via metrology and copper dishing and erosion. Techniques that were covered in this webinar included depth and CD metrology, profiling and full 3D die mapping. |
23. March 2011 ScanAsyst and PeakForce Tapping | PeakForce Tapping™ and ScanAsyst™ are two exciting new products recently released by Bruker. They are imaging modes that will change the way you think about Atomic Force Microscopy. While PeakForce Tapping adds a low interaction, direct force control imaging mode to the tool chest available to the nanotechnologist, ScanAsyst breaks the dogma that less user interaction makes the AFM easier to use but creates inferior data. In this Webinar we will explain PeakForce Tapping in the framework of Contact and Tapping Mode imaging. Examples of samples imaged in air and under liquids are given and were obtained on a variety of Bruker Atomic Force Microscopes. |
23. February 2011 Simultaneous Electrical and Mechanical Property Mapping at the Nanoscale with PeakForce TUNA | This webinar discusses the basics of PeakForce TUNA, compares it to standard Contact Mode based TUNA, and provides data demonstrating the unique capabilities and the differentiated applications enabled through the combination of PeakForce Tapping, and AFM conductivity measurements, on samples such as organic solar cells, lithium ion battery, and nano-materials. Watch the recording* - English [Windows Media] *Please skip to the 2 minute mark due to technical problems |
23. February 2011 峰值力导电原子力显微镜用于纳米尺度机械性能与导电性能的同时测量 | 此网络讲座将讨论峰值力导电原子力显微镜的基本知识，并通过与基于其他AFM成像模式的导电性能测量技术的比较，从原理上阐明其优势和独到之处。这一技术在有机太阳能电池，锂离子电池，及纳米材料方面的应用实例将使你窥探到其应用潜力。 |
26. January 2011 High Resolution Imaging With the BioScope Catalyst | From nucleic acids and proteins to protein assemblies and membranes, this webinar presented several examples of how high resolution imaging conducted with the BioScope Catalyst Atomic Force Microscope provides researchers with key opportunities to investigate biomolecules and biomolecular processes at the single molecule level. |
