Atomic Force Microscopy

Accurate Measurements, Advanced Technology, Meaningful Developments

Atomic force microscopy utilizes the combination of an advanced scanning probe microscope, sophisticated software, and a specific mode or technique that enables manufacturers, engineers, and researchers to precisely measure, investigate, and image the critical properties of a large variety of surfaces and samples. The main feature that all atomic force microscopes have in common is that the measurements are performed with a sharp probe scanning over a sample while maintaining a very close spacing to the surface. Atomic force microscopy was the first technology to produce real-space images of atomic arrangements on flat surfaces and is now most commonly used to perform very precise, 3D measurements on the angstrom-to-micrometer scale.

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Bruker manufactures world class atomic force microscopes and other nano technologies that incorporate the very latest advances in AFM techniques, including the revolutionary ScanAsyst™ AFM imaging mode and the PeakForce QNM® atomic force microscopy imaging mode to ideally suit a wide array of application areas, from biology to semiconductors, from data storage devices to polymers, and from integrated optics to measurement of forces between particles and surfaces. Other applications include metrology for MEMS fabrication, paints and coatings, metals/alloys/platings, plastics/polymers, biomaterials, biotechnology, food and food packaging, optics/optical films, optical disks, ceramics, thin films, liquid crystals, cosmetics, and geological and environmental studies.

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AFMs & Accessories

• Atomic Force Microscopes

• AFM Environmental Control Accessories

• AFM Probes

• AFM-Raman Solutions

Documents

Application Notes — Our AFM application notes are provided as a free learning resource in PDF format and are available for review or download

Brochures and Datasheets — Compare our microscopes and AFM technologies by downloading the brochures for your reference or use our atomic force microscopy datasheets to see our AFM metrology performance capabilities

Posters — An assortment of informative documents and downloads (including a Modes Poster that is perfect for any workstation)

Learning Resources & Nano Community

Nanoscale World Community — An open, worldwide resource for atomic force microscope owners, users, and enthusiasts. The community is designed to allow the exchange of ideas, share information, and provide help with integrity

Webinar Series — A groundbreaking AFM learning resource that provides a live, interactive format, with leading Bruker experts discussing topics gathered from your input - we invite you to join this series today

Webinar Series Archives — Check out our webinar series archives if you missed a previous broadcast

Videos

Bruker Nano Surfaces YouTube Channel — Subscribe to our channel to get access to all of our videos, submit feedback or comments on any video, and favorite videos you enjoy