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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA

Atomic Force Microscopes
Manufacturing AFM Solutions For Every Nano Metrology Need
Bruker Corporation's Nano Surfaces Division, AFM Business, manufactures atomic force microscopes (AFM) that drive the world's leading-edge research in AFM-Raman, life science, materials science, semiconductor, electrochemistry, and many other applications. These innovative metrology instruments open nanoscale investigation to every scientific discipline, and the decades of experience in proprietary AFM metrology at our disposal enable us to deliver unparalleled accuracy and resolution at price points for every budget.
Advances in research often calls for new types of data — Bruker's atomic force microscopes are manufactured to specifically provide the metrology data you need today for tomorrow's advancements.
See our featured atomic force microscopes & AFM accessories
Compare our atomic force microscope systems, platforms, and solutions
Watch our newest AFM video and subscribe to our YouTube channel
Related atomic force microscopy content & AFM links
Our Featured Atomic Force Microscopes & AFM Accessories
BioScope™ Catalyst™ AFM and PeakForce QNM® Imaging Mode used for imaging live biological samples and more
MultiMode® 8 Atomic Force Microscope — including the new ScanAsyst-HR AFM Imaging Mode
Dimension Edge™ PSS AFM with AutoMET Metrology Analysis Software
Dimension FastScan™ - The World's Fastest Atomic Force Microscope
Request more information about our featured atomic force microscopes and nano metrology solutions
Compare All Of Our AFM Products:
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BioScope Catalyst Atomic Force Microscope Accelerating discovery in life science research |
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Dimension Automated Atomic Force Profiler For chemical mechanical planarization and etch metrology |
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Dimension Edge Atomic Force Microscope Serious atomic force microscopy capabilities for every researcher |
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Dimension Edge PSS AFM with AutoMET™ Software World-leading Atomic Force Microscopy technology ideal for PSS applications and epi manufacturing |
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Dimension FastScan Atomic Force Microscope The world's fastest AFM — scan once and get all the details you need |
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Dimension Icon Atomic Force Microscope AFM performance and productivity redefined |
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Dimension X Automated Atomic Force Profiler Automated AFP cuts etch measurement turnaround time |
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Innova Scanning Probe Microscope Lowest noise, highest resolution SPM in its class |
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InSight 3D Automated Atomic Force Microscope Production-based 3D reference metrology for 45 nm and below |
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Integrated AFM-Raman Imaging System (IRIS) Catalyst-IRIS and Innova-IRIS atomic force microscopes |
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MultiMode 8 Atomic Force Microscope The Legendary MultiMode AFM Keeps Getting Better |
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Compact scanning head for OEM applications |
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Bruker AFM Probes Online Store Bruker is the only major AFM manufacturer that operates a probes nanofabrication facility - shop online today |
Request more information about our atomic force microscopes and nano metrology solutions
Watch Our Imaging Dynamic Processes at the Nanoscale Webinar Recording
Part of our groundbreaking Atomic Force Microscopy webinar series, this presentation shares the recent breakthroughs in high speed AFM imaging that has broadened dynamic imaging to a wider community of researchers and developers.
Don't have access to YouTube? Watch this video locally on your Windows Media Player by clicking here.
Find more information about the World's Fastest AFM
Request More Information
AFM Accessories
AFM Environmental Control 1-ppm Turnkey Solution — The most stringent 1-ppm gas purity enables the Dimension Icon AFM and MulitMode 8 AFM microscopes to perform in situ nanoelectrical and electrochemical characterization of organic photovoltaics (OPVs) and Lithium ion cathodes
VITA: AFM Nanoscale Thermal Analysis Module — Built on Bruker's extensive expertise with thermal measurements, VITA provides the Dimension Icon AFM, Dimension Edge AFM, Dimension Edge PSS, and the MultiMode 8 AFM microscopes an extended thermal measurement performance
Bruker AFM Probes — Bruker is the only leading atomic force microscope manufacturer that owns and operates its own AFM probe fabrication facility which enables our team to create probes specifically designed for high-speed AFM imaging modes with no loss of resolution
AFM Documents
Application Notes — Our AFM application notes are provided as a free learning resource in PDF format and are available for review or download
Brochures and Datasheets — Compare our microscopes and AFM technologies by downloading the brochures for your reference or use our atomic force microscopy datasheets to see our AFM metrology performance capabilities
Posters — An assortment of informative documents and downloads (including a Modes Poster that is perfect for any workstation)
Community, Learning Resource & Social
Nanoscale World Community — An open, worldwide resource for atomic force microscope owners, users, and enthusiasts. The community is designed to allow the exchange of ideas, share information, and provide help with integrity
Atomic Force Microscopy Webinar Series — A groundbreaking AFM learning resource that provides a live, interactive format, with leading Bruker experts discussing topics gathered from your input - we invite you to join this series today
Bruker Nano Surfaces YouTube Channel — Subscribe to our channel to get access to all of our videos, submit feedback or comments on any video, and favorite videos you enjoy













