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- XFlash® 6 – Bruker Introduces the Next Generation of EDS Detectors
- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
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Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
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Aug 19-21, Philadelphia, Pennsylvania, USA
TEM Documents
Articles
Structural changes in nickel silicide thin films under the presence of Al and Ga (External link to PDF document)
