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- D2 PHASER with XFlash® Detector - Combined XRD, EDXRD, and XRF analysis
- Testimonial for Dr. Bruce Kaiser's Hands-on workshop: Accurate Elemental Non-destructive XRF
- Testimonial for Dr. Bruce Kaiser's Hands-on workshop: Accurate Elemental Non-destructive XRF
- Bruker Elemental announces the winner of our S1 Sorter giveaway contest
- S1 SORTER testimonial from TP Consulting Services
- 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction
Sep 19-22, Karlsruhe, Germany - Good Diffraction Practice III - Powder XRD Instrumentation and Data Quality
Sep 30, Free Webinar - COM2010 - Conference of Metallurgists
Oct 03-06, Vancouver, British Columbia, Canada
Art & Archaeometry
Bruker has become the defacto choice for art and archaeometry applications, thanks to its capacity for completely non-destructive elemental identification. This lends itself to a wide variety of uses, such as investigating non-uniform samples, determining the provenance of a valued object, or obtaining elemental data for geochemical survey.
Restoration work can be achieved reliably and sensitively, by ensuring a close match of pigments and other materials. Safe repatriation of cultural artifacts is also made possible by the ability to detect trace toxic preservatives, in a way that is fully compliant with organizations such as NAGPRA.
Whatever the application, powerful desktop software provides a complete live spectral display to give you an instant insight into the specimen under observation. This can be customized to allow a basic test for the presence or absence of a particular element, or a complete analysis to provide concentration data.
Product suggestion
Tracer III-V/III-SD
Advantages
- Defacto standard in Art and Archaeometry application
- Avaliable in SiPIN or 10 mm2 X-Flash SDD
- Manual or Automatic filter
- Vacuum provides ultimate sensitivity for light elements


