QUANTAX EDS

SEM Documents

Application Notes

The goal of our application notes is to provide you with practical information on different uses of the QUANTAX system. They all describe the analysis of a sample step by step and highlight the advantages of using our energy dispersive spectrometers for this purpose.

 

Analysis of the elemental composition and thickness of a Fe-Ni film on Si using Bruker ESPRIT and SAMx STRATAGem


Advanced light element and low energy X-ray analysis of a TiB2 – TiC – SiC ceramic material using EDS spectrum imaging


Light element quantification with TQuant: Analyzing boron nitride (BN) at different acceleration voltages


Determining gunshot residue using 15 kV acceleration voltage with optimized spectra deconvolution and high resolution XFlash® silicon drift detectors


High resolution mapping of an oceanic drill core using the XFlash® Silicon Drift Detector


Determination of the alite to belite ratio in Portland cement clinker using high-speed mapping


Specific small particle search in large samples by feature analysis and chemical classification using QUANTAX


Identification of trace elements and their corresponding phases with the ESPRIT tool Maximum Pixel Spectrum


Spectroscopic phase analysis of a ternary alloy using ESPRIT HyperMap


Fast identification of mineral phases: High speed mapping with the XFlash® silicon drift detector (SDD) and description of advantages over the use of BSE images


Comparison of standardless and standard-based quantification, using Cr-Ni-steel as an example