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- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
- Bruker Announces New Website and Online Store for AFM Probes
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
Upgrade
- NANOS combined with a Leica microscope
NANOS - the smallest commercial AFM - is the ideal partner for your optical microscope. The NANOS head, the size, shape and mount of which approximate those of a normal microscope objective, is a fully fledged atomic force microscope.
It can be adapted to fit all common types of standard microscopes, as well as confocal or interferometric microscopes.
NANOS offers maximum versatility and allows to upgrade your microscope with full AFM capability, thus, providing real added value to already existing microscopy based inspection systems.
