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- 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction
Sep 19-22, Karlsruhe, Germany - Good Diffraction Practice III - Powder XRD Instrumentation and Data Quality
Sep 30, Free Webinar - COM2010 - Conference of Metallurgists
Oct 03-06, Vancouver, British Columbia, Canada
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AFM Techniques
- Magnetic domains in a YIG sample (Yttrium Iron Garnet)
Besides the direct approach of measuring topographic structures, Bruker AFMs are able to deliver multiple information on materials properties. All instruments can be equipped with a number of different scanning modes. Optionally, all modes can be added at the time of purchase or later as an upgrade.
The list of available modes includes:
- Contact Mode AFM
- Lateral Force Microscopy, friction measurement
- Force Modulation Microscopy (variable force applied to the tip) for measurements of elastic properties
- Nanolithography, nanomanipulation
- Dynamic AFM Modes, e.g. non-contact, intermittent, including phase contrast, FM detection mode, Q-factor control
- Piezo Response Microscopy
- Scanning Spreading Resistance Microscopy (SSRM) for measurements of resistance and conductivity
- Scanning Surface Potential Microscopy (SSPM) (Kelvin probe), for workfunction measurements
- Magnetic Force & Electrostatic Force Microscopy
- Force versus Distance Curves
- STM - Scanning Tunneling Microscopy