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Upcoming Events
- Building material characterization by X-ray methods
Mar 11, Complimentary webinar - Cast Expo
Mar 20-23, Orlando, Florida, USA - IM20
Mar 21-24, Miami, Florida, USA - Analytica
March 23-26, Munich, Germany - BCA
April 12-15, Warwick, Great Britain - Control 2010
May 04-07, Stuttgart, Germany
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Techniques
- Magnetic domains in a YIG sample (Yttrium Iron Garnet)
Besides the direct approach of measuring topographic structures, Bruker AFMs are able to deliver multiple information on materials properties. All instruments can be equipped with a number of different scanning modes. Optionally, all modes can be added at the time of purchase or later as an upgrade.
The list of available modes includes:
- Contact Mode AFM
- Lateral Force Microscopy, friction measurement
- Force Modulation Microscopy (variable force applied to the tip) for measurements of elastic properties
- Nanolithography, nanomanipulation
- Dynamic AFM Modes, e.g. non-contact, intermittent, including phase contrast, FM detection mode, Q-factor control
- Piezo Response Microscopy
- Scanning Spreading Resistance Microscopy (SSRM) for measurements of resistance and conductivity
- Scanning Surface Potential Microscopy (SSPM) (Kelvin probe), for workfunction measurements
- Magnetic Force & Electrostatic Force Microscopy
- Force versus Distance Curves
- STM - Scanning Tunneling Microscopy