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- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
- Bruker Announces New Website and Online Store for AFM Probes
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany

AFM Software
All systems of Bruker Nano come with a proprietary control software that allows to handle the AFM/SPM in the most intuitive way. Acquiring high resolution images is a matter of just a few minutes.
Besides the easy data acquisition, enormous functionality can be found in the image processing software. Any aspect of an image can be analyzed. Here are some important functions:
Basic functionality, including
- Visualization of image file navigation
- LMS polynomial plane correction
- Cross-section profile analysis
- Histogram
- Fourier Transform
- Auto - correlation
- Rotation
- 3D view, copy, print and
- Save functions
- Color palette editing
- Zoom
- Mirror
Extended functionality, including
- Correlation Averaging
- Extended Fourier analysis
- Roughness Analysis
- Filter Module with ISO standard filters
- Grain Analysis: Automated Grain, Particle and Pore detection and analysis
- 3D Visualization Studio
- Image Browser with database and report functionality


