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Upcoming Events
- Building material characterization by X-ray methods
Mar 11, Complimentary webinar - Cast Expo
Mar 20-23, Orlando, Florida, USA - IM20
Mar 21-24, Miami, Florida, USA - Analytica
March 23-26, Munich, Germany - BCA
April 12-15, Warwick, Great Britain - Control 2010
May 04-07, Stuttgart, Germany
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Software
All systems of Bruker Nano come with a proprietary control software that allows to handle the AFM/SPM in the most intuitive way. Acquiring high resolution images is a matter of just a few minutes.
Besides the easy data acquisition, enormous functionality can be found in the image processing software. Any aspect of the images can be analysed. Here is a list of some of the functions:
Basic functionality, including
- Visualization of image filesnavigation
- LMS polynomial plane correction
- Cross-section profile analysis
- Histogram
- Fourier Transform
- Auto - correlation
- Rotation
- 3D view, copy, print and
- Save functions
- Color palette editing
- Zoom
- Mirror
Extended functionality, including
- Correlation Averaging
- Extended Fourier analysis
- Roughness Analysis
- Filter Module with ISO standard filters
- Grain Analysis: Automated Grain, Particle and Pore detection and analysis
- 3D Visualization Studio
- Image Browser with database and report functionality


