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- 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction
Sep 19-22, Karlsruhe, Germany - Good Diffraction Practice III - Powder XRD Instrumentation and Data Quality
Sep 30, Free Webinar - COM2010 - Conference of Metallurgists
Oct 03-06, Vancouver, British Columbia, Canada
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AFM Software
- Data evaluation screen
All systems of Bruker Nano come with a proprietary control software that allows to handle the AFM/SPM in the most intuitive way. Acquiring high resolution images is a matter of just a few minutes.
Besides the easy data acquisition, enormous functionality can be found in the image processing software. Any aspect of an image can be analyzed. Here are some important functions:
Basic functionality, including
- Visualization of image file navigation
- LMS polynomial plane correction
- Cross-section profile analysis
- Histogram
- Fourier Transform
- Auto - correlation
- Rotation
- 3D view, copy, print and
- Save functions
- Color palette editing
- Zoom
- Mirror
Extended functionality, including
- Correlation Averaging
- Extended Fourier analysis
- Roughness Analysis
- Filter Module with ISO standard filters
- Grain Analysis: Automated Grain, Particle and Pore detection and analysis
- 3D Visualization Studio
- Image Browser with database and report functionality