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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- The Benefits of TXRF for Education and University Research
Mar 07, Webinar - Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
Scanning Spreading Resistance Microscopy (SSRM)
- Surface of ZnO, 1.8 x 1.8 µm2, top, SSRM channel, bottom, sample: Prof. A. Waag, TU Braunschweig
enables mapping of the differences of resistance and conductivity on the sample surface with nanometer resolution.
A durable and conductive (diamond coated) tip is used in contact mode while an adjustable DC bias voltage is applied between tip and sample. The topography and the current map is acquired simultaneously by measuring the current in a range of up to 7 magnitudes.
SSRM is the method of choice for analyzing electrical properties of electronic devices or conductive polymers.
