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News
- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
Resolution
- Atomic resolution with N8 ARGOS, sample HOPG
- Atomic steps observed with N8 NEOS, sample Si
Bruker AFMs provide highest resolution and sensitivity. Atomic resolution is achievable on our smallest system, N8 ARGOS, and the large sample platform, N8 TITANOS. N8 NEOS and N8 RADOS achieve sub-Ångstrom resolution, sufficient to clearly resolve atomic steps and carbon nanotubes.
The resolution attainable with the NANOS add-on AFM for upgrading optical microscopes is heavily dependent on the stability of the optical microscope it is installed on. Even though optical microscopes are not built for atomic resolution, Bruker provides accessories - e.g. active anti-vibration platforms and acoustic enclosures - that make upgraded optical microscope-AFMs an inspection tool with nanometer resolution.
