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News
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
- Bruker Announces New Website and Online Store for AFM Probes
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
Resolution
- Atomic resolution with N8 ARGOS, sample HOPG
- Atomic steps observed with N8 NEOS, sample Si
Bruker AFMs provide highest resolution and sensitivity. Atomic resolution is achievable on our smallest system, N8 ARGOS, and the large sample platform, N8 TITANOS. N8 NEOS and N8 RADOS achieve sub-Ångstrom resolution, sufficient to clearly resolve atomic steps and carbon nanotubes.
The resolution attainable with the NANOS add-on AFM for upgrading optical microscopes is heavily dependent on the stability of the optical microscope it is installed on. Even though optical microscopes are not built for atomic resolution, Bruker provides accessories - e.g. active anti-vibration platforms and acoustic enclosures - that make upgraded optical microscope-AFMs an inspection tool with nanometer resolution.
