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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- The Benefits of TXRF for Education and University Research
Mar 07, Webinar - Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
Raman/Confocal
The AFM inspection systems N8 NEOS, N8 RADOS, and N8 TITANOS can be upgraded with additional optical instrumentation.
- N8 NEOS SENTERRA AFM-Raman microscope
- N8 TITANOS with confocal and secondary video microscope
Raman microscopy
Raman microscopy allows to characterize the chemical composition of the sample. Combined with the high resolution imaging capability of AFM, the Raman microscope can easily be directed to the structures of interest. Bruker's SENTERRA Raman microscope can be mounted on the N8 NEOS prividing a perfect match of the two technologies.
Confocal microscopy
Confocal microscopy is a convenient and fast method for quantifying surface structures. It provides quick mapping capabilities with nanometer resolution in the vertical and optical resolution in inplane direction. Confocal microscopy complements the high resolving power of AFM in that it allows to precharacterize surface structures very fast. If a very efficient quantitative surface inspection has to be implemented, AFM and confocal microscopy are the ideal partners. We can offer confocal microscopy on our N8 RADOS and N8 TITANOS products.
