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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- The Benefits of TXRF for Education and University Research
Mar 07, Webinar - Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
Piezo Response Microscopy
- Piezo response of an electroceramics, 2 x 2 µm2
is used to measure the mechanical response of (piezo electric) materials to an applied voltage.
In contact mode an AC voltage is applied to the sample. Due to the piezo electric properties the sample will expand or shrink with the frequency of the applied voltage. A lock-in amplifier analyzes the reaction of the deflection of the cantilever at the modulation frequency. Thanks to the interferometric detection principle the deflection is displayed in nm and can be converted into pm/V - the unit for the piezo electric effect.
This method is mainly used for piezo electric ceramics.
