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- Combined optics and AFM: 800 µm x 900 µm, left, and AFM image, right, 4 µm x 4 µm.
A common problem with stand-alone AFM is the limited scanning area. Most commercial systems are equipped with inferior video microscopes with the main intent of aligning laser beam and cantilever. These microscopes can be used for a rough orientation on the sample surface, but as the magnification is low and the cantilever blocks most of the field of view, they are useless for finding smaller defects or identifying structures.
Efficiently position the scanning probe
By combining high quality research grade microscope optics with the NANOS AFM, Bruker Nano provides an efficient way to directly position the scanning probe at the location of interest.
Therefore, the large field of view offered by an optical microscope is seamlessly linked with the resolution and detail of the AFM.
In the figure above, the picture on the left shows a microscope image of an ion beam treated area on a metal surface. The field of view is about 800 µm wide. By simply positioning the area of interest under the microscope's cross-hair and then engaging the NANOS, you get high resolution AFM results at the first approach.
- The NANOS AFM on a N8 NEOS
N8 NEOS
While the NANOS can be combined with many quality microscopes, Bruker Nano has developed the N8 NEOS as a complete optical/atomic force microscope, with solid granite base and extra vibration isolation. It provides a smooth workflow and handles various samples sizes. It is the ideal AFM for a research or analytical lab.
