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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- The Benefits of TXRF for Education and University Research
Mar 07, Webinar - PITTCON 2012
Mar 11-15, Orlando, Florida, USA - APEX2 Workshop – Twinning and Disordered Samples
Mar 20-22, Taipei, Taiwan - ARAB LAB 2012
Mar 26-29, Dubai, UAE - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
Atomic Force Microscopy Modes & Techniques
- Magnetic domains in a YIG sample (Yttrium Iron Garnet)
Besides the direct approach of measuring topographic structures, Bruker AFMs are able to deliver multiple information on materials properties. All instruments can be equipped with a number of different scanning modes.
Bruker introduces highest resolution nanoelectrical and electrochemical AFM technology.
Available AFM Modes & Techniques:
More Information
The perfect companion to any SPM workstation — Download the Scanning Probe Microscopy Modes Poster (PDF size 1 MB)
ScanAsyst Exclusive Self-Optimizing Atomic Force Microscopy Imaging Mode (PDF brochure)
PeakForce Quantitative Nanomechanical Property Mapping (PDF brochure)
