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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
Magnetic Force & Electrostatic Force Microscopy (MFM & EFM)
- Hard Disk, topography, image size is 4 x 4 µm2, Z-Range is 10 nm
- MFM channel
helps to visualize magnetic properties, if a magnetic stray field is present.
The magnetic forces are measured - mostly in the dynamic mode - using a tip with a magnetic coating.
For the measurement of long range magnetic forces the distance between tip and sample is increased. The magnetic coating of the tip interacts with the magnetic stray field. This interaction influences the amplitude and phase of the oscillation of the cantilever.
MFM channels (phase & amplitude) and topography are acquired simultaneously.
Typical samples are hard disks, metal alloys, magnetic nanoparticles.
Additional long range force interactions can be characterized by:
- Eddy Current Microscopy (ECM), a non-contact method that allows to explore resistivity variations and
- Electrostatic Force Microscopy (EFM), which maps localized surface charges in metals and insulators.
