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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- The Benefits of TXRF for Education and University Research
Mar 07, Webinar - Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
Magnetic Force & Electrostatic Force Microscopy (MFM & EFM)
- Hard Disk, topography, image size is 4 x 4 µm2, Z-Range is 10 nm
- MFM channel
helps to visualize magnetic properties, if a magnetic stray field is present.
The magnetic forces are measured - mostly in the dynamic mode - using a tip with a magnetic coating.
For the measurement of long range magnetic forces the distance between tip and sample is increased. The magnetic coating of the tip interacts with the magnetic stray field. This interaction influences the amplitude and phase of the oscillation of the cantilever.
MFM channels (phase & amplitude) and topography are acquired simultaneously.
Typical samples are hard disks, metal alloys, magnetic nanoparticles.
Additional long range force interactions can be characterized by:
- Eddy Current Microscopy (ECM), a non-contact method that allows to explore resistivity variations and
- Electrostatic Force Microscopy (EFM), which maps localized surface charges in metals and insulators.
