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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
Interferometry
- Fiber optic interferometer
Unlike many commercially-available AFMs, Bruker provides also instruments employing fiberoptic interferometry. Interferometry is in some cases superior to conventional beam deflection (optical lever) techniques as it provides calibrated measurements of the tip/probe movements. That means Bruker AFMs allow cantilever amplitude values to be set in nanometers not in mV (as with other commercial systems). In addition, spectroscopic modes, e.g. deflection vs. distance curves etc., also provide calibrated results.
- The optimum position of the cantilever (green zone) is automatically controlled
Easy exchange of cantilevers
The patented cantilever holder allows an easy exchange of cantilevers without complicated adjustments of the laser beam, guaranteeing fastest experiment set-up times.
The fiber-optic-based design makes the Bruker NANOS AFM the most compact system on the market.
