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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- The Benefits of TXRF for Education and University Research
Mar 07, Webinar - Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
Interferometry
- Fiber optic interferometer
Unlike many commercially-available AFMs, Bruker provides also instruments employing fiberoptic interferometry. Interferometry is in some cases superior to conventional beam deflection (optical lever) techniques as it provides calibrated measurements of the tip/probe movements. That means Bruker AFMs allow cantilever amplitude values to be set in nanometers not in mV (as with other commercial systems). In addition, spectroscopic modes, e.g. deflection vs. distance curves etc., also provide calibrated results.
- The optimum position of the cantilever (green zone) is automatically controlled
Easy exchange of cantilevers
The patented cantilever holder allows an easy exchange of cantilevers without complicated adjustments of the laser beam, guaranteeing fastest experiment set-up times.
The fiber-optic-based design makes the Bruker NANOS AFM the most compact system on the market.
