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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- The Benefits of TXRF for Education and University Research
Mar 07, Webinar - Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
Force Modulation Microscopy (FFM)
- Etched steel surface, topography, image size is 390 x 390 nm2, Z-Range is 40 nm
- FMM channel
displays information about the elastic properties of a sample.
During the measurement in contact or in the dynamic mode the tip-sample distance is modulated, at a frequency high enough that the topography feedback can not follow this modulation. In the dynamic mode this causes an amplitude modulation of the cantilever oscillation. In contact mode the deflection of the cantilever changes periodically with the modulation frequency.
Analyzing the interferometer signal
Analyzing the interferometer signal at the modulation frequency reveals information about the elastic properties.
This method is useful for materials with nonuniform mechanical properties, like polymer blends and metal alloys.
