AFM Features - NANOS AFM / SPM products

Bruker Nano supplies AFMs/SPMs that

• provide fast and easy navigation
• can be operated by users with introductory training only, yet offer all modes and options required for advanced research
• use fiber optic interferometry for calibrated cantilever deflection measurements
• cover the range from large scan areas (combined with traceable AFM (optional)) to highest resolution
• can be upgraded with other techniques, e.g. Raman, confocal microscopy
• can be combined with your existing optical/confocal/interferometric microscope, or similar inspection tools
• are available in versions for samples up to 300 mm diameter

In short, we have the right solution for your SPM application!