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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
AFM Features - NANOS AFM / SPM products
- The compact NANOS AFM
Bruker Nano supplies AFMs/SPMs that
- provide fast and easy navigation
- can be operated by users with introductory training only, yet offer all modes and options required for advanced research
- use fiber optic interferometry for calibrated cantilever deflection measurements
- cover the range from large scan areas (combined with traceable AFM (optional)) to highest resolution
- can be upgraded with other techniques, e.g. Raman, confocal microscopy
- can be combined with your existing optical/confocal/interferometric microscope, or similar inspection tools
- are available in versions for samples up to 300 mm diameter
In short, we have the right solution for your SPM application!
