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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA

AFM Environmental Control 1-ppm Turnkey Solutions
New Atomic Force Microscopy Research Opportunities
Bruker's environmental control packages for Dimension® Icon®, Dimension Edge™, and MultiMode® 8 AFMs provide the most stringent 1-ppm gas purity requirements to enable in situ nanoelectrical and electrochemical characterization of organic photovoltaics (OPVs) and Lithium ion cathodes.
The AFM Turnkey Solution
- Most stringent environmental control augments exclusive AFM capabilities
- Turnkey solutions guarantee performance of integrated systems
- Critical functionality enables organic photovoltaics and Li battery research


