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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- The Benefits of TXRF for Education and University Research
Mar 07, Webinar - Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
Contact mode AFM
- Contact mode measurement on SnO2, 3 x 3 µm2, max. height: 230 nm
is the most straightforward, basic topography imaging mode of the AFM.
In contact mode, the AFM tip has a direct contact with the sample. While the tip is scanned along the surface, the sample topography induces a vertical deflection of the cantilever. This deflection is measured by a fiber- optical interferometer. An active vertical feedback system maintains a preset load force (= static deflection) on the cantilever.
Contact mode - basis for further SPM techniques
Contact mode is suitable for materials science, biological applications and basic research. It also serves as a basis for further SPM techniques, which require direct tip-sample contact. Contact mode imaging is part of the basic configuration of the NANOS and N8 product series.
