Language
Search
News
- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- The Benefits of TXRF for Education and University Research
Mar 07, Webinar - PITTCON 2012
Mar 11-15, Orlando, Florida, USA - APEX2 Workshop – Twinning and Disordered Samples
Mar 20-22, Taipei, Taiwan - ARAB LAB 2012
Mar 26-29, Dubai, UAE - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
AFM-Raman
The Widest Variety of Combined Atomic Force Microscopy & Raman Spectroscopy Configurations
- Bruker Innova-IRIS integration with Renishaw InVia
As the leading manufacturer of atomic force microscopes, Bruker provides the widest variety of AFM-Raman (atomic force microscopy and Raman spectroscopy) configurations that meet even the most stringent requirements. Bruker configurations include the IRIS systems that use tip-enhanced Raman spectroscopy (TERS), and the latest co-located atomic force microscopy and Raman spectroscopy platform.
See related technologies, applications, video, and more
TERS-Enabled Solutions
The Bruker IRIS (Integrated AFM-Raman Imaging System) family of systems are proven to enable TERS. They can be configured as the Innova-IRIS for opaque samples and the BioScope™ Catalyst™-IRIS for transparent samples. IRIS integrates the highest atomic force microscopy performance seamlessly with leading micro-Raman systems to address your nanoscale spectroscopy application needs.
Co-Located Solutions
The Dimension Icon AFM-Raman system combines the industry-leading atomic force microscopy platform and an advanced, research-grade confocal µ-Raman microscope on a single, sophisticated, flexible platform. While the NEOS SENTERRA combines the proprietary Bruker technology of the NEOS (the highest resolution optical microscope based atomic force microscope) and the SENTERRA (a Raman spectrometer featuring permanent wave number calibration and high sensitivity) providing excellent data confidence in correlated AFM and Raman characterization.
See our co-located AFM-Raman platforms
Request More Information
TERS-Enabled Integrated AFM-Raman Systems
• BioScope Catalyst-IRIS for Transparent Samples
• Innova-IRIS for Opaque Samples
Co-Located AFM-Raman Systems
Documents
Advances in Combined Atomic Force Microscopy and Raman Spectroscopy (Application Note, PDF)
Dimension Icon AFM-Raman Microscope (Datasheet, PDF)
IRIS (Integrated AFM-Raman Imaging System) (Brochure, PDF)
NEOS SENTERRA Atomic Force Microscopy and Raman Spectroscopy Platform (Flyer, PDF)
Publications
Pushing Raman to the Nanoscale (Oct. 2011 – Chemical & Engineering News)
Learning Resources & Nano Community
Nanoscale World Community — An open, worldwide community designed to allow the exchange of ideas, share information, and provide support
Webinar Series — A groundbreaking AFM learning resource - we invite you to join this series today
Webinar Series Archives — If you missed our Atomic Force Microscopy meets Raman Spectroscopy webinar presentation, check out our webinar series archives
Videos
AFM Meets Raman Spectroscopy — Atomic force microscopy and Raman spectroscopy applications are examined in this webinar presentation
High Resolution Imaging With the BioScope Catalyst — Examples of how high resolution imaging provides researchers with key opportunities to investigate biomolecules and biomolecular processes at the single molecule level
Bruker Nano Surfaces YouTube Channel — Subscribe to our channel to get access to all of our videos, submit feedback or comments on any video, and favorite videos you enjoy
