Advanced phase ID using combined EBSD&EDS on SEM

Electron backscatter diffraction (EBSD) and energy dispersive X-ray spectrometry (EDS) are common analytical methods used on the scanning electron microscope (SEM). The two complementary techniques provide structural and respectively compositional information. Continuing to build on its recent developments in integrating EBSD and EDS, Bruker is now releasing an advanced phase identification feature. This new method will significantly increase efficiency when dealing with multiphase materials and allow expert as well as less experienced users to acquire the best quality results.

This webinar focused on describing the new phase identification procedure and its advantages over the common phase identification method. Our experts will present numerous application examples from materials science as well as earth sciences.

Who should attend?

• Researchers working in electron microscopy labs studying crystalline materials
• Materials and Earth sciences lecturers and students