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Product News
- Bruker AXS Announces Agreement to Acquire Atomic Force Microscopy (AFM) Company S.I.S. Surface Imaging Systems GmbH
- Bruker AXS Microanalysis Introduces New Ultra-High Energy Resolution XFlash® 5000 Silicon Drift Detector Series at M&M 2008
- Dr. Joseph Goldstein, Distinguished Professor,University of Massachusetts, Amherst Wins 2008 Duncumb Award for Excellence in Microanalysis
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Welcome to Bruker AXS
Bruker AXS designs and manufactures analytical X-ray systems for elemental analysis, materials research and structural investigations. Our innovative solutions enable a wide range of customers in heavy industry, chemistry, pharmacy, semiconductor, life science and nanotechnology to make technological advancements and to accelerate their progress.
