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Product News
- Bruker AXS Announces New G4 PHOENIX Combustion Analysis System with Infrared Furnace for Determination of Diffusible Hydrogen in Wide Range of Metals Applications
- Bruker AXS Announces Closing of S.I.S. Acquisition and Exhibits its New Atomic Force Microscopy (AFM) Product Line at EMC 2008
- Bruker AXS Announces Agreement to Acquire Atomic Force Microscopy (AFM) Company S.I.S. Surface Imaging Systems GmbH
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Techniques
The instruments of Bruker Nano are known for their capability of high resolution imaging of surface topography. The unmatched performance reaches down to an atomic resolution level and provides quantitative data of surface structures. Besides the direct approach of measuring topographic structures, our systems are able to deliver a lot more of information on materials properties. All of our instruments can be equipped with the most important scanning modes. The standard version comes with contact mode capabilities. All other modes can be added optionally at the time of purchase or later as an upgrade. The list of available modes includes:
- Non - contact, intermittent, and close - contact mode, including phase contrast
- Frequency detection mode, including Q - Factor Control
- Field contrast modes (magnetic force, electrostatic force mode,
- MFM / EFM) for simultaneous imaging of long ranging interactions
- Force modulation mode (variable force applied to the tip) for measurements of elastic properties
- Lateral force mode, friction measurement
- Surface potential mode (Kelvin probe), for workfunction measurements
- STM - Scanning Tunneling Microscopy
- Spreading Resistance for measurements of resistance and conductivity
- Force versus Distance Curves
Further options for upgrading your NANOS AFM/SPM system
- Metrology sensor (additional sensor for high repeatability of vertical measurements, reproducibility of - Z < 1%)
- Liquid immersion capability (sealed version of the NANOS AFM/SPM)