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  • Bruker AXS Introduces the D2 CRYSO™ System, a Large Crystal Orientation Analyzer Based on Novel ED-XRD Technology

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Documents

Application Reports


181 KB

Reziproke Gitterkarten tensil verspannter Epitaxieschichten R88-D00001.pdf


180 KB

Reciprocal space maps of tensile strained epitaxial layers R88-E00001.pdf


911 KB

Reciprocal space maps of relaxed buffer heterostructure R88-E00002.pdf


274 KB

Structural quality of thin AlxGa1-xN layers R88-E00003.pdf


970 KB

Barrier Layer Quality Control for Semiconductor DOC-R88-EXX004.pdf

 
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