XFlash® QUAD 4040 Detector

The XFlash® QUAD is the first four channel silicon drift detector (SDD) for energy dispersive spectrometry. This member of our SD detector family impresses with incredible speed and sensitivity.

The QUAD provides a total active area of

40 mm² which is divided into 4 separate channels of 10 mm² each.

The great advantage of this new design concept is that the detector maintains the high energy resolution of a single 10 mm² SDD while offering 4 times the solid angle and throughput capability.

Combining the large active area with high energy resolution of < 133 eV (Mn Kα, at 100,000 cps, 127 or 129 eV optionally available) makes the XFlash® QUAD highly efficient for elemental analyses even in low beam current situations, e.g. in high resolution imaging mode or for the analyis of sensitive samples.

But not only traditional spectrum acquisition can be significantly sped up. While maintaining excellent energy resolution, the XFlash® QUAD accepts up to 3,000,000 cps input count rate. Therefore this detector is also ideal for new analytical techniques, such as spectral imaging (PTS, HyperMap). While most EDS systems offer this useful feature, it tends to be very time consuming when done with conventional Si(Li) based spectrometers. With the performance of the XFlash® QUAD it is now possible to use spectral imaging as the technique of choice for routine analysis.

Like all XFlash® Detectors the QUAD does not require liquid nitrogen or any other cooling agents and operates absolutely vibration free.