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- D2 PHASER with XFlash® Detector - Combined XRD, EDXRD, and XRF analysis
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Oct 03-06, Vancouver, British Columbia, Canada
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Technology
- S2 PICOFOX - TXRF for mobile use
The combination of innovative ideas with most modern X-ray technology results in a new generation of TXRF spectrometers. Until recently this analysis method was limited to stationary instruments with X-ray tubes in the kW range and semiconductor detectors with liquid nitrogen cooling.
Employing state-of-the-art technology opened up the possibility to accommodate this highly sensitive method in a very compact, portable instrument:
- a specially designed, very compact and air-cooled fine-focus X-ray tube in metal-ceramics technology
- a modern multi-layer X-ray optics for beam focussing and monochromatization
- a Peltier-cooled, high resolution XFlash® X-ray detector (SDD) of the latest generation.
As a result, this TXRF-spectrometer is totally independent of liquid nitrogen and cooling water! The maximum power consumption is only 180 W, which makes it especially interesting for mobile applications.
Working principle
As a special EDXRF method, total reflection X-ray fluorescence spectroscopy (TXRF) is distinguished by its geometric conditions for both excitation of the sample and detection of the fluorescence radiation.
- TXRF working principle
The primary beam generated by a X-ray tube is monochromatized by Bragg-reflection on a multilayer. The monochromatized X-rays hit a polished sample carrier (quartz glass or acrylic glass) under a very shallow angle of incidence. The X-rays are totally reflected by the surface of the sample carrier under these conditions and thus fluorescence radiation is emitted only by the sample substance deposit on the carrier surface.
- Low limits of detection
One important advantage of this principle is the minimization of scattering. At the same time the geometric setup allows for a very short distance between sample and detector, resulting in very high detection efficiency for the fluorescence radiation. The combination of both effects leads to an improvement of sensitivity by several orders of magnitude.
In addition, the preparation of the sample substance as a thin layer avoids matrix effects. Therefore quantitative analysis can easily be performed using an internal standard.