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3D Surface Measurement

The History, Development, Advantages & Applications

3D surface measurement (three-dimensional surface measurement) is used by both the industrial sector and scientific community to drive the success of critical research projects, crucial developments, and fundamental productions and process controls. The 3D surface measurement parameters (S parameters) were defined in 1991 by the attendees of the first EC Workshop and have since been developed in accordance with ISO standards to complement the traditional 2D (two-dimensional) metrology R parameters.

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3D Surface Measurement's Initial Definitions

Much of the early work to develop standard, worldwide 3D surface measurement parameters was completed by a European consortium. Their work resulted in four general categories: amplitude, spatial, hybrid and functional.

How 3D S parameters improve surface performance beyond 2D R parameters alone

The amplitude parameters are based on overall heights and include the root-mean-square of height distribution, skewness (or the degree of asymmetry of a surface height distribution), the degree of peakedness of a surface height distribution (or kurtosis), and an average of the highest and lowest points.

Spatial parameters are based on frequencies of features and include the texture direction of a surface, texture aspect ratio, and the density of summits.

Based on a combination of height and frequency, the hybrid parameters include the mean summit curvature, developed surface area ratios, and the root-mean-square of surface slopes.

Finally, the functional parameters include several parameters that are based on applicability of particular functions.

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How 3D Surface Measurement Developed

The initial resistance to using the techniques of 3D surface measurement was eventually overcome as R&D engineers took the time to fully understand the advantages of three-dimensional surface analysis and a shift became apparent as the S parameters were employed on more and more drawings and suppliers were being held to those specifications.

It was found that 3D surface parameters helped to improve communication and allowed a process control that traditional R parameters could not do alone.

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Modern 3D Surface Measurement

Modern 3D surface measurement has given engineers, process designers, and quality control professionals a significantly improved toolkit for describing surfaces since three-dimensional measurements uniquely differentiate not only surface shapes but functionalities as well. All of which, ultimately, results in better surface performance.

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3D Optical Microscopes and Optical Profilers

• ContourGT-X8 PSS 3D Optical Microscope

• ContourGT-X8 3D Optical Microscope

• ContourGT-X3 3D Optical Microscope

• ContourGT-K1 3D Optical Microscope

• ContourGT-K0 3D Optical Microscope

• NPFLEX 3D Surface Metrology System

• NPFLEX-LA 3D Surface Metrology System for Lead Angle

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Accessories

AcuityXR Enhanced-Resolution Microscopy Technology - Break the optical diffraction limit and gain a metrology benefit impossible to achieve with any other conventional optical microscopy technique.

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Applications

• Aerospace Industry & Automotive Manufacturing

• High-Brightness LED Manufacturing & Light-Emitting Diode Wafer Inspection

• Medical Arterial Stents

• MEMS — Micro-Electro Mechanical Systems

• Solar Industry — Roughness Characterization

• Your Application Needs

Videos

ContourGT 3D Optical Microscopes Video — If you do not have access to YouTube, this video is also available to watch locally on your machine in MP4 format - Click Here

Extending Lateral Resolution of Optical Profiling Beyond the Optical Diffraction Limit Webinar Recording — The ContourGT series of 3D Optical Microscopes, using the AcuityXR Optical Microscopy Accessory, produce higher lateral resolution measurement of features than has ever before been achieved in a commercial microscope. and concludes with the audience-driven Q&A session.

Optical Microscopy and Stylus Profilometry Webinar Series — Register to attend an upcoming webinar, review recordings locally on your machine, download our presentation slides, or join our Optical Microscopy & Stylus Profilometry Email List for updates and other learning opportunities.

Precision Metrology for Enhanced Solar Efficiency Webinar Recording — Learn the benefits gained by using 3D optical microscopes and the DektakXT stylus profiler to increase the efficiency of solar materials and optimize solar production costs.

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